学術論文
J. Wang and Y. Yano, “Investigation of issues in electrostatic discharge testing for automotive Ethernet transceiver ICs and electronic components” (invited paper, in Japanese), Trans. of IEICE, vol. J108-B, no. 2, pp. 13-22, Feb. 2025.
J. Wang and Y. Yano, “Investigation of issues in electrostatic discharge testing for automotive Ethernet transceiver ICs and electronic components” (invited paper, in Japanese), Trans. of IEICE, vol. J108-B, no. 2, pp. 13-22, Feb. 2025.